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- 產品銷售 - 自動四點探針 / 手動四點探針 / 四點探針針頭 / 非接觸式阻值量測 / Lifetime量測 / 晶片厚度彎曲度量測

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- 應用領域 - Sheet Resistance / Resistivity / Metal Film thickness  - 自動四點探針 / 手動四點探針

                   - Non-contact Resistivity Measurement - 非接觸式阻值量測

                   - Contact P/N Type measurement - 手動四點探針

                   - Non-contact P/N Type measurement - 非接觸式阻值量測

                   - Silicon wafer lifetime measurement - Lifetime量測

                   - Wafer thickness / bow / warp measurement - 晶片厚度彎曲度量測

 - 材料 - Substrates -  GaAs Wafer / GaAs Ingot

                              - Ge Wafer / Ge Window / Ge Optics

                              - SiC wafer / SiC Ingot

             - Epi Wafers - GaN Epi wafer

                                 - SiC Epi wafer

                                 - QWIP /QDIP wafer

             - Rs / Resistivity / VLSI Standard sample