MAST Technology Corp.

 

Applications

Sheet Resistance / Resistivity: CDE (Auto Mapping) / Jandel (Manual)

Non-contact Resistivity Tester

Auto Resistivity Mapping System for LCD/Touch panel/Thin Film Solar

Lifetime Tester

Thickness Measurement of Metal Film

Wafer Thickness Measurement

Wafer Bow/ Warp/ Flatness Measurement

 

Material & Parts :

Gannium Arsenide Wafer/ Ingot

Silicon Carbine Wafer

Germanium Rod/ Sheet/ Single crystal wafer

Probe Head of 4 point probe: CDE ResMap / KT Rs meter / Napson / 4Dimensions / AIT

High Purity Metal

GaN Epi wafer

SiC Epi wafer         

 

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